EE4C08 Measurement and instrumentation
This course offers a broad introduction to measurement and instrumentation systems. The basic elements of such systems will be presented: transducers, amplifiers, filters and analog-to-digital converters. The different sources of error (noise, interference, offset, non-linearity, aliasing) that limit the performance of such systems will be discussed. Methods of analytically determining the corresponding detection limits will be presented, and in particular how errors can be referred to the input of a system and represented by equivalent voltage/current sources.
Several techniques for mitigating measurement errors will be discussed in detail e.g. the use of feedback, filtering, synchronous modulation, chopping, auto-zeroing, dynamic element matching.
The course will conclude with a measurement laboratory. Students may choose ONE of the following topics: Device characterization, RF measurements or LF measurements.
Study Goals
Students should be able to:
- understand the specifications of instruments and measurement systems
- determine the main error sources and the associated detection limits of measurement systems
- use measurement techniques to reduce measurement errors
- perform basic RF/LF/DC measurements
Teachers
dr.ir. Michiel Pertijs (EI)
Sensor interface circuits, smart sensors, ultrasonic imaging, acoustic sensors, energy efficiency, ultra-low power design, (self-)calibration techniques, capacitive sensors, precision analog circuits.
dr.ir. Qinwen Fan (ECTM)
high-performance class D audio amplifiers; smart power inverters in wide bandgap semiconductors, low-power DC-DC converters for energy harvesters; low-power circuits for IoT nodes.
dr. Tomás Manzaneque (EI)
Microsystems, piezoelectric devices, ultrasound transducers, resonant sensors, acoustic devices.
Last modified: 2023-11-04
Details
| Credits: | 5 EC |
|---|---|
| Period: | 4/0/0/0 |
| Contact: | Michiel Pertijs |